Fig. 12From: A new method to detect event-related potentials based on Pearson’s correlationCase 5. Left: W(C, X, J) from ERP pure wave + random noise, Jitter = 78 ms, RCS width about 860 ms, average of 100 ERPs. Right: with the same processing of the W'(C, X, J) array, now both the peaks overlap and are visibleBack to article page